Equivalent Circuit Expression of Dual Tem Cell Apparatus for Shielding Material Evaluation

To clarify the correspondence between Shielding Effectiveness (SE) of shielding materials and their physical property, we propose an equivalent circuit for a shielding effectiveness test apparatus using a dual TEM cell, and show its validity. By considering the structure of dual TEM cell that consists of a pair of cells coupled via an aperture in their common wall, we defined the capacitance C and mutual inductance M , those respectively express the electric coupling and magnetic coupling between two center conductors. By the measurement of unloaded S-parameter, we determined the values of C and M for a dual TEM cell in hand. Next, the shielding material was approximated by the apparent sheet resistivity Rs, and was used in the equivalent circuit of loaded aperture. As a result, the coupling level calculated from the equivalent circuit agreed well with the measured data in frequencies below 300 MHz.